MIRTEC, the Global Leader in Inspection Technology, announces that it presented two awards to its sales distributors on Wednesday, April 17, 2013 during the SMT/Hybrid/Packaging exhibition in Nuremberg, Germany. The ceremony took place in distributor pc tec’s booth, located in Hall 7, Stand 504.
Thursday, April 18, 2013
MIRTEC Co., Ltd. “The Global Leader in Inspection Technology”, today announced that it will premier its complete line of 3D AOI, SPI and LED inspection systems in Booth #1G68 at NEPCON China 2013, scheduled to take place April 23-25, 2013 at the Shanghai World EXPO Exhibition & Convention Center. MIRTEC has gained a solid reputation in the industry by providing unprecedented performance, quality and cost-effectiveness to the inspection environment. Company representatives will demonstrate the MV-9 Series 25 Mega Pixel 2D/3D AOI System, MS-15 Series 25 Mega Pixel 3D SPI System and MV-9UP Series LED Package 2D/3D Inspection System.
MIRTEC, “The Global Leader in Inspection Technology”, announces that it has named Precision Automation & Assembly (PAA) its Manufacturer’s Representative of the year for 2012. Precision Automation & Assembly is a manufacturers’ representative firm that provides high-quality equipment and consumables for electronic assembly in New England.
Tuesday, March 26, 2013
MIRTEC, the Global Leader in Inspection Technology, announces that it will highlight its 2D/3D In-Line AOI Series configured with MIRTEC’s exclusive OMNI-VISION® 3D Inspection Technology in Booth # 7-504 at the SMT/Hybrid/Packaging 2013 exhibition and conference, scheduled to take place April 16-18, 2013 at the Messezentrum in Nuremberg, Germany.
Monday, February 4, 2013
MIRTEC, the Global Leader in Inspection Technology, announces the opening of a new manufacturing facility in Europe to further strengthen business and local support. Based in Plymouth, UK, this expanded facility allows the company to better support its complete range of automatic optical inspection, X-ray inspection and solder paste inspection systems.